Formal Test Suite Index (T00–T07)
The formal test suite comprises 8 core test suites designed to prove reliability, security, and protocol fidelity under extreme laboratory conditions.
1. Test Suite Navigation
graph TD
T00["T00: Host & Firmware Compilation"]
T01["T01: Installer Wi-Fi & Commissioning"]
T02["T02: Modbus RTU & Meter Drivers"]
T03["T03: Time Synchronization & RTC"]
T04["T04: Storage Resilience & Power Loss"]
T05["T05: Cloud Ingestion & Offline Buffer Drain"]
T06["T06: Cryptography, OTP & Security"]
T07["T07: Long-Term Soak & Thermal Reliability"]
T00 --> T01
T01 --> T02
T02 --> T03
T03 --> T04
T04 --> T05
T05 --> T06
T06 --> T07
2. Test Case Directory
T00: Host and Firmware Build System
- Scope: Compiler verification, Pico SDK 2.2.0 compatibility, FreeRTOS 11.1 RP2350 port, LittleFS memory map validation.
- Key Tests: Clean compile, UF2 image generation, map file symbol allocation check.
T01: Installer Wi-Fi & Commissioning
- Scope: SoftAP initialization, captive portal behavior, DHCP lease allocation, REST API endpoints.
- Key Tests: SoftAP beacon timing, WPA2 handshake, web panel form validation, meter discovery scan.
T02: Modbus & Meters Communication
- Scope: RS-485 transceiver driver, differential signal polarity, parity handling, LEM-60 & DTSU666 register decoding.
- Key Tests: Single meter polling, multi-drop daisy chain (up to 50 meters), frame timeout handling, CRC error rejection.
T03: Time Synchronization & Hardware RTC
- Scope: PCF8523 / DS3231 I2C interface, battery backup switchover, trusted time flag validation.
- Key Tests: Power-off time retention, cold boot RTC read, NTP calibration slew rate, invalid date handling.
T04: Storage & Power Loss Recovery
- Scope: LittleFS FIFO queue, microSD dual-mirror block architecture, AES-256-GCM authenticated encryption.
- Key Tests: Power cut during flash write, corrupted sector detection, SD card hot-removal, generation counter rollback prevention.
T05: Cloud Ingestion & Offline Database
- Scope: Mutual TLS handshake, MQTT QoS 1 delivery, schema v3 payload generation, queue drain upon reconnection.
- Key Tests: Broken connection queue accumulation, rapid queue flush on link restoration, backend deduplication verification.
T06: Security, Cryptography & OTA
- Scope: Hardware OTP keys, bootloader ECDSA P-256 signature checks, anti-rollback protection, local panel lockout.
- Key Tests: Tampered firmware UF2 rejection, brute-force PIN lockout, private key extraction resistance.
T07: Reliability, Thermal & Release Soak
- Scope: Continuous operation under high ambient temperature, heap memory leak detection, long-term watchdog fidelity.
- Key Tests: 72-hour continuous soak test, flash endurance stress, memory allocation stability.